2002Unpublished venueRequires access

The application of acoustic microscopy to the characterisation of non-standard microelectronic packaging structures

W. Lawton, John Barrett

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Abstract

The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.

About this research paper

What this paper is about

The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.

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Available abstract

The constant progress of the microelectronics packaging industry towards smaller, cheaper, faster and more reliable products has led to the development of many new advanced and direct IC attach packaging technologies, i.e. Chip-on-Board, Flip Chip and Ball Grid Arrays. The quality and reliability of these technologies is a very important consideration in determining the success of such products. This paper will report on the benefits and limitations found in employing the acoustic microscopy analysis technique to the characterisation, from a reliability perspective, of these advanced microelectronic packaging technologies.

Key concepts: Microelectronics, Flip chip, Electronic packaging, Reliability (semiconductor), Integrated circuit packaging, Ball grid array, Chip-scale package, Chip

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