2002•Unpublished venueRequires access

A comprehensive reliability assessment tool for electronic systems

D.D. Dylis, Mary G. Priore

Open publisher page 24 citations

Abstract

The Reliability Analysis Center (RAC) has developed a new methodology and associated engineering software tool, PRISM, to assess the reliability of electronic systems. The methodology includes new component-level reliability prediction models (RACRates) as well as a process for assessing the reliability of systems due to noncomponent variables which are major contributors to electronic system reliability. This new methodology factors in all available test and/or field reliability data as it becomes available on a program to form the best estimate of field reliability.

About this research paper

What this paper is about

The Reliability Analysis Center (RAC) has developed a new methodology and associated engineering software tool, PRISM, to assess the reliability of electronic systems. The methodology includes new component-level reliability prediction models (RACRates) as well as a process for assessing the reliability of systems due to noncomponent variables which are major contributors to electronic system reliability. This new methodology factors in all available test and/or field reliability data as it becomes available on a program to form the best estimate of field reliability.

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OpenAlex reports 24 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

The Reliability Analysis Center (RAC) has developed a new methodology and associated engineering software tool, PRISM, to assess the reliability of electronic systems. The methodology includes new component-level reliability prediction models (RACRates) as well as a process for assessing the reliability of systems due to noncomponent variables which are major contributors to electronic system reliability. This new methodology factors in all available test and/or field reliability data as it becomes available on a program to form the best estimate of field reliability.

Key concepts: Reliability (semiconductor), Reliability engineering, Computer science, Field (mathematics), Software quality, Component (thermodynamics), Software, Engineering

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