High side application을 위한 700V double-RESURF nch-LDMOS 소자 개발
문남칠, 전본근, 권경욱, 이창준, 박주원, 성근식, 김희대, 김남주, 유광동
Abstract
문남칠, 전본근, 권경욱, 이창준, 박주원, 성근식, 김희대, 김남주, 유광동
Abstract
In this paper, two kinds of robust 700V DR-LDMOS (Double RESURF LDMOS) using thin epitaxial technology has been realized for level shifter and switching applications. The P-TOP layer is introduced to reduce on-resistance while maintaining high breakdown voltage for switching applications, and to increase on-breakdown voltage using JFET resistance for level shifter. The result is that the breakdown voltage of the 700V LDMOS for level shifter is 900V with on-breakdown of over 650V. In terms of switching applications, we have adopted HVPWELL layer of rainbow shape at source corner region to reduce n-type charge of N-EPI region and achieved the breakdown voltage of over 750V.
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In this paper, two kinds of robust 700V DR-LDMOS (Double RESURF LDMOS) using thin epitaxial technology has been realized for level shifter and switching applications. The P-TOP layer is introduced to reduce on-resistance while maintaining high breakdown voltage for switching applications, and to increase on-breakdown voltage using JFET resistance for level shifter. The result is that the breakdown voltage of the 700V LDMOS for level shifter is 900V with on-breakdown of over 650V. In terms of switching applications, we have adopted HVPWELL layer of rainbow shape at source corner region to reduce n-type charge of N-EPI region and achieved the breakdown voltage of over 750V.
Key concepts: LDMOS, JFET, Breakdown voltage, Materials science, Electrical engineering, Optoelectronics, Voltage, High voltage