Reusable embedded debugger for 32 bit RISC processor using the JTAG boundary scan architecture
Dae-Young Jung, Sung-Ho Kwak, Moon-Key Lee
Abstract
Dae-Young Jung, Sung-Ho Kwak, Moon-Key Lee
Abstract
The traditional debug tools for chip tests and software developments need huge investment and plenty of time. These problems can be overcome by an embedded debugger based the JTAG boundary scan architecture. Thus, the IEEE 1149.1 standard is adopted by ASIC designers for testability problems. We designed the RED (reusable embedded debugger) using the JTAG boundary scan architecture. The proposed debugger is applicable for not only chip test but also software debugging. Our debugger has an additional hardware module (EICEM: embedded ICE module) for more critical real-time debugging.
OpenAlex reports 10 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The traditional debug tools for chip tests and software developments need huge investment and plenty of time. These problems can be overcome by an embedded debugger based the JTAG boundary scan architecture. Thus, the IEEE 1149.1 standard is adopted by ASIC designers for testability problems. We designed the RED (reusable embedded debugger) using the JTAG boundary scan architecture. The proposed debugger is applicable for not only chip test but also software debugging. Our debugger has an additional hardware module (EICEM: embedded ICE module) for more critical real-time debugging.
Key concepts: Debugger, Debugging, Embedded system, Boundary scan, Computer science, Background debug mode interface, Testability, Software