From fan-out wafer to fan-out panel level packaging
Tanja Braun, Karl‐Friedrich Becker, S. Raatz, V. Bader, J. Bauer, R. Aschenbrenner, S. Voges, T. Thomas, R. Kahle, K.-D. Lang
Abstract
Tanja Braun, Karl‐Friedrich Becker, S. Raatz, V. Bader, J. Bauer, R. Aschenbrenner, S. Voges, T. Thomas, R. Kahle, K.-D. Lang
Abstract
Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics for heterogeneous system integration. This paper describes the technological path from wafer level embedding to 24"×18" fan-out panel level packaging technology in combination with low cost PCB based RDL processes and discusses challenges and opportunities in detail. The technology described offers a cost effective packaging solution for various application as autonomous sensor nodes, packages for handheld consumer application or bio-medical application as sensor integration into microfluidics.
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Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics for heterogeneous system integration. This paper describes the technological path from wafer level embedding to 24"×18" fan-out panel level packaging technology in combination with low cost PCB based RDL processes and discusses challenges and opportunities in detail. The technology described offers a cost effective packaging solution for various application as autonomous sensor nodes, packages for handheld consumer application or bio-medical application as sensor integration into microfluidics.
Key concepts: Fan-out, Wafer-level packaging, Microelectronics, Wafer, Wafer-scale integration, Packaging engineering, Engineering, Fan-in