Measurement of the thermoelectric properties of bulk and thin film materials
L. R. Danielson
Abstract
Open-access reader
L. R. Danielson
Abstract
Open-access reader
The figure-of-merit (Z) of a thermoelectric material is defined as Z = S{sup 2}/{rho}k, where S is the Seebeck coefficient, {rho} is the electrical resistivity, and k is the thermal conductivity. Since Z is composed of three components, it is sensitive to measurement errors in each of the components. For example, a Seebeck coefficient measurement which is only 17% high combined with electrical resistivity and thermal conductivity measurements which are 17% too low will result in a Z value which is double the correct value. It is therefore important to observe correct technique when performing measurements of S, {rho}, and k; and to recognize the limitations of the measurements. The purpose of the course is to address some of those issues in order to increase the accuracy of the thermoelectric measurements.
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The figure-of-merit (Z) of a thermoelectric material is defined as Z = S{sup 2}/{rho}k, where S is the Seebeck coefficient, {rho} is the electrical resistivity, and k is the thermal conductivity. Since Z is composed of three components, it is sensitive to measurement errors in each of the components. For example, a Seebeck coefficient measurement which is only 17% high combined with electrical resistivity and thermal conductivity measurements which are 17% too low will result in a Z value which is double the correct value. It is therefore important to observe correct technique when performing measurements of S, {rho}, and k; and to recognize the limitations of the measurements. The purpose of the course is to address some of those issues in order to increase the accuracy of the thermoelectric measurements.
Key concepts: Materials science, Thermoelectric effect, Thin film, Optoelectronics, Engineering physics, Composite material, Nanotechnology, Physics