1996University of North Texas Digital Library (University of North Texas)Open access

Measurement of the thermoelectric properties of bulk and thin film materials

L. R. Danielson

Open full text 6 citations

Abstract

The figure-of-merit (Z) of a thermoelectric material is defined as Z = S{sup 2}/{rho}k, where S is the Seebeck coefficient, {rho} is the electrical resistivity, and k is the thermal conductivity. Since Z is composed of three components, it is sensitive to measurement errors in each of the components. For example, a Seebeck coefficient measurement which is only 17% high combined with electrical resistivity and thermal conductivity measurements which are 17% too low will result in a Z value which is double the correct value. It is therefore important to observe correct technique when performing measurements of S, {rho}, and k; and to recognize the limitations of the measurements. The purpose of the course is to address some of those issues in order to increase the accuracy of the thermoelectric measurements.

Open-access reader

About this research paper

What this paper is about

The figure-of-merit (Z) of a thermoelectric material is defined as Z = S{sup 2}/{rho}k, where S is the Seebeck coefficient, {rho} is the electrical resistivity, and k is the thermal conductivity. Since Z is composed of three components, it is sensitive to measurement errors in each of the components. For example, a Seebeck coefficient measurement which is only 17% high combined with electrical resistivity and thermal conductivity measurements which are 17% too low will result in a Z value which is double the correct value. It is therefore important to observe correct technique when performing measurements of S, {rho}, and k; and to recognize the limitations of the measurements. The purpose of the course is to address some of those issues in order to increase the accuracy of the thermoelectric measurements.

Why it matters

OpenAlex reports 6 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The figure-of-merit (Z) of a thermoelectric material is defined as Z = S{sup 2}/{rho}k, where S is the Seebeck coefficient, {rho} is the electrical resistivity, and k is the thermal conductivity. Since Z is composed of three components, it is sensitive to measurement errors in each of the components. For example, a Seebeck coefficient measurement which is only 17% high combined with electrical resistivity and thermal conductivity measurements which are 17% too low will result in a Z value which is double the correct value. It is therefore important to observe correct technique when performing measurements of S, {rho}, and k; and to recognize the limitations of the measurements. The purpose of the course is to address some of those issues in order to increase the accuracy of the thermoelectric measurements.

Key concepts: Materials science, Thermoelectric effect, Thin film, Optoelectronics, Engineering physics, Composite material, Nanotechnology, Physics

Related papers

Back to paper searchBrowse research topicsOriginal source
Measurement of the thermoelectric properties of bulk and thin film materials — Research Paper | ScholarLens