Computer study of charge dynamics within electrical tree structures

The main reason of dielectric loss and the destruction of high-voltage insulation is partial discharges (PD) resulting in electrical treeing. The tree structure grows into the volume of dielectric due to the material damage on account of energy released during partial discharges. Therefore registration and analysis of PD spatial-temporal characteristics seems to be important both for theoretical studies of electrical treeing and practical evaluation of long-term electric strength of insulation constructions. In the present paper, the self-consistent model of electrical treeing proposed by the authors in 1998 is applied to study PD characteristics and charge dynamics within electrical tree structures.