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Raman And Far Infrared Diagnostics Of Semiconductor Superlattices

T. Dumejow, Andrew Hamilton, Terence J. Parker, Bryce N. Samson, Steven Rathgeb Smith, D. R. Tilley, C. T. B. Foxon, J. J. Harris, Karen J. Moore

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Key concepts: Superlattice, Semiconductor, Raman spectroscopy, Far infrared, Materials science, Optoelectronics, Infrared, Optics

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