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2005•Bulletin of the American Physical SocietyRequires access

Electromagnetic response in Scattering-type Scanning Near-field Optical Microscopy

Javier Aizpurua, F. Javier Garcı́a de Abajo, Pedro Miguel Echenique

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Key concepts: Optical microscope, Microscopy, Optics, Electromagnetic field, Scattering, Materials science, Field (mathematics), Near and far field

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