1974•OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)Requires access
Interaction of the primary radiation defects with impurities in p-type silicon at 80 to 200 K
В.С. Вавилов, L.G. Kolodin, B.N. Makashev, K.H. Nussupov, А.В. Спицын, Zh.S. Takibaev, K.B. Tnishtikbaev
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