2008•哈尔滨工业大学学报：英文版Requires access
Analysis on testing and operational reliability of software
赵靖, 刘宏伟, 崔刚, 王慧强
Open publisher page 0 citations
Abstract
This record does not include an abstract. Use the full-text link above if available.
赵靖, 刘宏伟, 崔刚, 王慧强
Abstract
An abstract is not available in the OpenAlex record for this paper.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Key concepts: Reliability engineering, Reliability (semiconductor), Computer science, Software quality, Software reliability testing, Software, Engineering, Software development