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The Development and Validation of a Scale Measuring Attitudes toward Statistics

Steven L. Wise

Open publisher page 290 citations

Abstract

This study describes the development and validation of a new instrument entitled Attitudes Toward Statistics (ATS) to be used in the measurement of attitude change in introductory statistics students. Two ATS subscales are identified: Attitude Toward Course and Attitude Toward the Field, respectively. These subscales were demonstrated to have both high internal consistency and test-retest reliability. It is further shown that each ATS subscale provides distinctly different information about the attitudes of introductory statistics students.

About this research paper

What this paper is about

This study describes the development and validation of a new instrument entitled Attitudes Toward Statistics (ATS) to be used in the measurement of attitude change in introductory statistics students. Two ATS subscales are identified: Attitude Toward Course and Attitude Toward the Field, respectively. These subscales were demonstrated to have both high internal consistency and test-retest reliability. It is further shown that each ATS subscale provides distinctly different information about the attitudes of introductory statistics students.

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OpenAlex reports 290 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This study describes the development and validation of a new instrument entitled Attitudes Toward Statistics (ATS) to be used in the measurement of attitude change in introductory statistics students. Two ATS subscales are identified: Attitude Toward Course and Attitude Toward the Field, respectively. These subscales were demonstrated to have both high internal consistency and test-retest reliability. It is further shown that each ATS subscale provides distinctly different information about the attitudes of introductory statistics students.

Key concepts: Internal consistency, Psychology, Scale (ratio), Statistics, Reliability (semiconductor), Test (biology), Psychometrics, Consistency (knowledge bases)

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