Probabilistic safety analysis. Interim report No. 1
R.C. Erdmann, R.R. Fullwood, Alexander García-Aristizábal, John Kelly, F. L. Leverenz
Abstract
R.C. Erdmann, R.R. Fullwood, Alexander García-Aristizábal, John Kelly, F. L. Leverenz
Abstract
This report summarizes work carried out during the first year of LWR probabilistic safety analysis. A large amount of useful source material was provided by the draft report of the Reactor Safety Study (WASH-1400), and much of the SAI activity during the past year was based upon the Study's methods, data, and results. Chapters 2 and 3 of this document briefly present, respectively, a summary and a critique of WASH-1400. Also covered in the report are: the performance of a sensitivity analysis to determine which systems contribute significantly to overall risk in a BWR; consequence analyses for a PWR and BWR for each of the accident categories given in WASH-1400; SAI accident sequence calculations; the development of the BAM code for analyzing logic diagrams and its comparison with existing codes; and data gathering activity necessary to the reliability analyses conducted. (GRA)
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This report summarizes work carried out during the first year of LWR probabilistic safety analysis. A large amount of useful source material was provided by the draft report of the Reactor Safety Study (WASH-1400), and much of the SAI activity during the past year was based upon the Study's methods, data, and results. Chapters 2 and 3 of this document briefly present, respectively, a summary and a critique of WASH-1400. Also covered in the report are: the performance of a sensitivity analysis to determine which systems contribute significantly to overall risk in a BWR; consequence analyses for a PWR and BWR for each of the accident categories given in WASH-1400; SAI accident sequence calculations; the development of the BAM code for analyzing logic diagrams and its comparison with existing codes; and data gathering activity necessary to the reliability analyses conducted. (GRA)
Key concepts: Probabilistic logic, Reliability (semiconductor), Interim, Computer science, System safety, Engineering, Reliability engineering, Forensic engineering