2007AIP conference proceedingsRequires access

High-Resolution Anti-Parallel Double-Crystal Spectrometer at BL15XU in SPring-8

H. Oohashi, Aurel Mihai Vlaicu, Daiki Horiguchi, K. Yokoi, H. Mizota, Shusuke Sakakura, Y. Ito, Tatsuki Tochio, Hiroshi Y. Yoshikawa, Sei Fukushima, Takashi Shoji

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Abstract

A simple double‐crystal spectrometer with an anti‐parallel setting was developed in the third generation synchrotron facility BL15XU, SPring‐8. This is derived by modifying the commercial RIGAKU Spectrometer (3580E). Although the resolving power of the two‐crystal x‐ray spectrometer is largely dependent on the perfection of the crystals, the x‐ray spectrometer secures high resolving power, intensity, and reproducibility. This system is convenient for the experiment of Resonant Inelastic X‐ray Scattering (RIXS). As an example, RIXS data of several elements in ferroelectric materials LiTaO3 and BaTiO3 and XAS spectra of Cu metal and Cu oxide are presented.

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A simple double‐crystal spectrometer with an anti‐parallel setting was developed in the third generation synchrotron facility BL15XU, SPring‐8. This is derived by modifying the commercial RIGAKU Spectrometer (3580E). Although the resolving power of the two‐crystal x‐ray spectrometer is largely dependent on the perfection of the crystals, the x‐ray spectrometer secures high resolving power, intensity, and reproducibility. This system is convenient for the experiment of Resonant Inelastic X‐ray Scattering (RIXS). As an example, RIXS data of several elements in ferroelectric materials LiTaO3 and BaTiO3 and XAS spectra of Cu metal and Cu oxide are presented.

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Available abstract

A simple double‐crystal spectrometer with an anti‐parallel setting was developed in the third generation synchrotron facility BL15XU, SPring‐8. This is derived by modifying the commercial RIGAKU Spectrometer (3580E). Although the resolving power of the two‐crystal x‐ray spectrometer is largely dependent on the perfection of the crystals, the x‐ray spectrometer secures high resolving power, intensity, and reproducibility. This system is convenient for the experiment of Resonant Inelastic X‐ray Scattering (RIXS). As an example, RIXS data of several elements in ferroelectric materials LiTaO3 and BaTiO3 and XAS spectra of Cu metal and Cu oxide are presented.

Key concepts: Spectrometer, SPring-8, Crystal (programming language), Materials science, Scattering, Optics, Synchrotron, Analytical Chemistry (journal)

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