Practical Design Issues to Bump and Flip
Jack Bogdanski, Jim Leal, Hong Yang
Abstract
Jack Bogdanski, Jim Leal, Hong Yang
Abstract
As wafer bumping and flip chip attach techniques gain momentum in the chip packaging industry, awareness of the latest enabling design requirements and advantages will help the design and packaging engineer optimize the system cost, performance and reliability. Attention to the die level and wafer level parameters and details that make economical, scaleable, and manufacturable bump and flip IC's are the. topic of this paper.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
As wafer bumping and flip chip attach techniques gain momentum in the chip packaging industry, awareness of the latest enabling design requirements and advantages will help the design and packaging engineer optimize the system cost, performance and reliability. Attention to the die level and wafer level parameters and details that make economical, scaleable, and manufacturable bump and flip IC's are the. topic of this paper.
Key concepts: Bumping, Flip chip, Thermal copper pillar bump, Reliability (semiconductor), Chip-scale package, Engineering, Reliability engineering, Manufacturing engineering