1991•Unpublished venueRequires access

Study of TEM micrographs of thin-film cross-section replica using spectral analysis

Jinfa Tang, Ting Mei, Xü Liu, Peifu Gu

Abstract

The method of spectral analysis for studying the TEM micrograph of thin film replicas is presented. It has been proved that there are spectral losses in the TEM micrograph, which are concerned with the thickness of the replica. A TEM micrograph of the thin film cross section replica is studied with the aid of a computer.

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Available abstract

Key concepts: Micrograph, Replica, Materials science, Electron micrographs, Cross section (physics), Optical microscope, Optics, Thin section