Statistical EMC: A New Dimension in Electromagnetic Compatibility of Digital Electronic Systems

Statistical analysis provides a new perspective on electromagnetic compatibility (EMC) of digital electronic systems and leads to important practical results. In the paper, the electromagnetic compatibility compliance test results are used as a data base to address three classes of EMC related problems: statistical EMC profile of digital electronic systems, the equipment under test (EUT) parameter effects on the electromagnetic emission characteristics, and EMC measurement specifics. A comparison is made and statistical correlation factor concept is introduced of the EUT highest radiated emissions measured in an open area test site (OATS) and absorber lined shielded room (AR). The suggested statistical evaluation methodology can be utilized to correlate different EMC test techniques, characterize the EMC performance of electronic systems and components, and develop recommendations for electronic product optimal EMC design.