Optical Characterization of Graphene and Highly Oriented Pyrolytic Graphite
R. Kostić, M. Mirić, Tea Mišić Radić, Marko Radović, Radoš Gajić, Zoran V. Popović
Abstract
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R. Kostić, M. Mirić, Tea Mišić Radić, Marko Radović, Radoš Gajić, Zoran V. Popović
Abstract
Open-access reader
We present a symmetry analysis of allowed infrared and Raman modes in graphene and highly oriented pyrolytic graphite.Surface structure for highly oriented pyrolytic graphite is examined using atomic force microscopy.As experimental tools, we used infrared spectroscopic ellipsometry in order to investigate the pseudodielectric function of highly oriented pyrolytic graphite in the mid-infrared range (500-7000 cm -1 ) and Raman spectroscopy to investigate the influence of layers number decrease.As a result, we propose a method for an experimental verification of graphene.
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We present a symmetry analysis of allowed infrared and Raman modes in graphene and highly oriented pyrolytic graphite.Surface structure for highly oriented pyrolytic graphite is examined using atomic force microscopy.As experimental tools, we used infrared spectroscopic ellipsometry in order to investigate the pseudodielectric function of highly oriented pyrolytic graphite in the mid-infrared range (500-7000 cm -1 ) and Raman spectroscopy to investigate the influence of layers number decrease.As a result, we propose a method for an experimental verification of graphene.
Key concepts: Pyrolytic carbon, Highly oriented pyrolytic graphite, Raman spectroscopy, Graphene, Materials science, Graphite, Characterization (materials science), Infrared