2011•Unpublished venueRequires access

Advanced Imaging Modes

Vladimir V. Tsukruk, Srikanth Singamaneni

Abstract

This chapter contains sections titled: Surface Force Spectroscopy Friction Force Microscopy Shear Modulation Force Microscopy Chemical Force Microscopy (CFM) Pulsed Force Microscopy Colloidal Probe Microscopy Scanning Thermal Microscopy Kelvin Probe and Electrostatic Force Microscopy Conductive Force Microscopy Magnetic Force Microscopy Scanning Acoustic Force Microscopy High-Speed Scanning Probe Microscopy References

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Available abstract

Key concepts: Microscopy, Force spectroscopy, Magnetic force microscope, Scanning probe microscopy, Conductive atomic force microscopy, Scanning ion-conductance microscopy, Kelvin probe force microscope, Scanning Force Microscopy