Mouna Chetibi-Riah, Mohamed Masmoudi, Hichame Maanane, Jrme Marcon, Karine Mourgues, M. Kétata, Philippe Eudeline
Abstract
Accurate LDMOS Model Extraction Using DC, CV and Small Signal S Parameters Measurements for Reliability Issues
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Accurate LDMOS Model Extraction Using DC, CV and Small Signal S Parameters Measurements for Reliability Issues
Key concepts: LDMOS, Reliability (semiconductor), Extraction (chemistry), Reliability engineering, SIGNAL (programming language), Computer science, Materials science, Electronic engineering