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Functional Test Generation For finite State Machines With Concurrent Fault Simulation

N.L. Cooray, E.W. Czeck

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Abstract

This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.

About this research paper

What this paper is about

This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.

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Available abstract

This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.

Key concepts: Fault coverage, Finite-state machine, Sequence (biology), Fault (geology), Automatic test pattern generation, Generator (circuit theory), Computer science, State (computer science)

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