2003•IEICE Transactions on Information and SystemsRequires access

Non-scan Design for Testability for Synchronous Sequential Circuits Based on Fault-Oriented Conflict Analysis

Dong Xiang, Shan Gu, Hideo Fujiwara

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Key concepts: Computer science, Testability, Design for testing, Automatic test pattern generation, Fault (geology), Sequential logic, Fault coverage, Reliability engineering

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