Shih Kai Lin, I-Chen Lin, Tsung Sheng Kao, Din Ping Tsai
Abstract
Nano recording and readout on optical disk are investigated by a novel characterization method with ultrahigh resolution. Optical and thermal mechanisms of nano recording and readout on phase-change disk are discussed and proposed
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Nano recording and readout on optical disk are investigated by a novel characterization method with ultrahigh resolution. Optical and thermal mechanisms of nano recording and readout on phase-change disk are discussed and proposed
Key concepts: Optical disc, Optical recording, Nano-, Characterization (materials science), Materials science, Optoelectronics, Optics, Computer science