ScholarLens Back to search
1954•Unpublished venueOpen access

THICKNESS MEASUREMENTS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY

T Bartlett, F. Ball

Open full text 0 citations

Abstract

K-25 Plant

About this research paper

What this paper is about

K-25 Plant

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

K-25 Plant

Key concepts: Transmittance, Refractive index, Optics, Interferometry, Substrate (aquarium), Materials science, Thin film, Physics

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
THICKNESS MEASUREMENTS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY — Research Paper | ScholarLens