Modeling switched-current functional block circuits using VHDL-AMS language

This paper proposes the behavioral models of the second-generation switched-current functional block circuits using the VHDL-AMS language. The proposed models cannot only characterize the ideal behavior of the SI circuits, but also capture the SI higher order non-ideal effects, which include the charge injection effects and device mismatch effects. The accuracy of the proposed models is verified by the VHDL-AMS simulator ZENI1.0. The experimental results have shown that compared with SPICE, the behavioral modeling error is less than 1.8%, while time-domain behavioral simulation speed up is 1 to 2 orders.