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Iodine Induced Damage in Semiconductor Materials During Heavy Ion Recoil Elastic Recoil Detection Analysis

Scott R. Walker, Peter Johnston, I.F. Bubb, W.B. Stannard, David N. Jamieson, Sean P. Dooley, David D. Cohen, N. Dytlewski, J.W. Martin

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Key concepts: Recoil, Elastic recoil detection, Heavy ion, Materials science, Elastic recoil, Semiconductor, Ion, Radiochemistry

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