1999•The Indian Journal of Agricultural SciencesOpen access

Identification of amplified fragment length polymorphism markers associated with Karnal bunt (Neovossia indica) resistance in bread wheat

Sukhwinder Singh, Tejinder Singh Grewal, Harjit Pal Singh, Monika Sodhi, Harcharan Singh Dhaliwal

Abstract

Amplified fragment length polymorphism markers were used to study polymorphism and their association with Karnal bunt resistance genes in wheat (Triticum aestivum L. emend. Fiori & Paol.). Recombinant inbred lines developed from a cross of a Karnal bunt susceptible 'WL 711' and a Kamal-bunt resistant line 'HD 29' were tested for resistance to 2 Kamal bunt isolates through artificial inoculations. Study of parents and a set of recombinant inbred lines (selected on the basis of Karnal bunt reaction) for amplified fragment length polymorphism with 6 primer combinations were analyzed and 336 loci scored. Of these, 77 were polymorphic between the parents. Three of the polymorphic markers were associated with Karnal bunt resistance genes.

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Key concepts: Biology, Primer (cosmetics), Inbred strain, Polymorphism (computer science), Genetics, Veterinary medicine, Genotype, Gene