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Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES)

J. Cazaux

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Key concepts: X-ray photoelectron spectroscopy, Auger electron spectroscopy, Electron spectroscopy, Spectroscopy, Analytical Chemistry (journal), Chemistry, Materials science, Nuclear magnetic resonance

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Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES) — Research Paper | ScholarLens